Skip to content

Silicon Carbide Substrates for Power Devices

SiC substrates are widely utilized in electric vehicle power devices to maximize their efficiency and reliability, helping reduce energy loss, shorten charging times, save space in the vehicle, as well as save weight. This helps save on space and weight.

Optics microscopy is one of the most frequently employed inspection techniques for silicon carbide substrate. It creates images of its surface with both dark-field and bright-field modes that reveal specific defect information.

Manufacturing

Manufacturing silicon carbide substrates is an involved and demanding process that requires expertise and precision. Manufacturers must carefully regulate temperature gradients and gas flow rates to avoid contamination; and use post-growth processing techniques like slicing, grinding, polishing and surface preparation to guarantee quality wafers for final device performance.

Silicon carbide substrates are versatile high-performance materials used for various high-performance applications. They’re especially helpful in power electronics systems due to their ability to withstand high temperatures and voltages while having outstanding thermal conductivity and hardness properties, making them suitable for a range of demanding uses ranging from automobiles to renewable energy systems.

SiC’s high price has hampered its wider adoption for years. According to market research firm TrendForce, however, prices should drop as technology improvements and economies of scale increase production. Furthermore, larger size substrates will bring lower chip costs per chip while helping manufacturers reach higher utilization rates resulting in overall cost reductions; with poly-SiC substrates playing an especially crucial role as they provide higher throughput than mono-SiC substrates in cost reduction efforts.

Applications

SiC substrates have become widely employed across a wide variety of applications. Electric vehicle (EV) manufacturers utilize them for developing more energy-efficient power devices that extend driving range and facilitate quicker charging times, while power conversion firms utilize them to boost the efficiency of solar and wind energy systems. Their use has grown due to advances in manufacturing technology and material properties.

SiC is ideal for battery-powered devices, EVs and renewable energy systems due to its wide bandgap which enables operation at higher voltages for enhanced efficiency gains. Furthermore, its excellent thermal conductivity facilitates heat dissipation enabling compact designs with lower cooling costs; all these factors combine together making SiC an excellent material choice.

However, for optimal performance of these devices to occur, high-quality substrates are required. High operating temperatures of power semiconductors can cause thermal stress that leads to mechanical fatigue and early device failure – this issue can be addressed using advanced packaging materials with secure interconnects.

At present, the market for 6-inch SiC substrates is expanding rapidly due to partnerships between wafer manufacturers and companies in industries like electric vehicles and renewable energy. These partnerships are driving innovation while encouraging the widespread adoption of SiC technology for various applications. In addition, innovations in crystal growth technology and wafer processing processes are making these substrates more cost-effective so they can be utilized by a wider array of businesses.

Defects

Silicon carbide (SiC) is an attractive material for power devices due to its high dielectric breakdown resistance and wide band gap. Unfortunately, extended defects that form can negatively impact device performance; to mitigate this threat manufacturers must implement rigorous process controls within their fabrication facilities as well as use inspection/metrology tools to monitor quality assurance on wafers produced.

Advanced epitaxial growth techniques are revolutionizing SiC wafer quality. This approach allows for precise control over doping profile and thickness of epitaxial SiC layers, essential in attaining desired electrical properties in wafers. Doping, the practice of injecting impurities into SiC layers to alter conductivity, can either be accomplished via ion implantation or during epitaxial growth process itself; commonly done via nitrogen dopants for electron-rich conductivity or aluminum or boron dopants for hole-rich conductivity. Typical dopants include nitrogen for electron-rich conductivity while aluminum or boron dopants can alter conductivity to produce desired electrical properties in wafers.

As the quality of SiC wafers improves, understanding their types of crystal defects has become ever more crucial. Researchers have utilized scanning electron microscopy (SEM) to locate these flaws. Furthermore, surface defects have been divided into two groups according to step morphology; an etching treatment using molten potassium hydroxide creates pits with various shapes depending on what kind of defect was present at its loci.

Cost

Silicon carbide substrate costs are currently the main obstacle to manufacturers hoping to produce high-performance SiC devices, however this price can be reduced through manufacturing processes that minimize crystal defects and ensure material uniformity, helping SiC devices compete more closely against traditional technologies like silicon.

Silicon carbide wafers and substrates are experiencing rapid expansion as demand for high-performance SiC power devices increases. These devices are widely used across a variety of applications such as automotive electronics and renewable energy systems; providing high temperature capability, fast electron velocity and excellent thermal conductivity as well as low noise switching characteristics – perfect for high performance electronics applications.

As demand for silicon carbide devices grows, many manufacturers are moving towards transitioning to 8-inch wafers as an important step in developing them. This move marks an important milestone in SiC device production, and should significantly decrease individual device costs as larger wafers yield more chips while decreasing waste.

8-inch wafers are currently in trial production with limited availability; however, prices have begun to decrease as manufacturers increase production capacity. According to Chinese manufacturer TankeBlue Semiconductor, upgrading from 6-inch substrates to 8-inch substrates can lower unit costs by 50% while increasing performance and device lifespan.

en_USEnglish